Initial leakage current paths in the vertical-type GaN-on-GaN Schottky barrier diodes

Author:

Sang Liwen12,Ren Bing1,Sumiya Masatomo3ORCID,Liao Meiyong3,Koide Yasuo24ORCID,Tanaka Atsushi24,Cho Yujin1,Harada Yoshitomo5ORCID,Nabatame Toshihide12,Sekiguchi Takashi1,Usami Shigeyoshi4,Honda Yoshio4,Amano Hiroshi24

Affiliation:

1. International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan

2. Amano-Koide Collaborative Research Lab, National Institute for Materials Science, (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan

3. Wide Bandgap Materials Group, National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan

4. Institute of Materials and Systems for Sustainability, Nagoya University, Furo-cho c3-1, Nagoya, Aichi 464-8601, Japan

5. Hosei University, Koganei, Tokyo 184-8584, Japan

Funder

Ministry of Education, Culture, Sports, Science and Technology (MEXT)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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