A 1-Tb Density 4b/Cell 3D-NAND Flash on 176-Tier Technology with 4-Independent Planes for Read using CMOS-Under-the-Array

Author:

Pekny Ted1,Vu Luyen1,Tsai Jeff1,Srinivasan Dheeraj1,Yu Erwin1,Pabustan Jonathan1,Xu Joe1,Deshmukh Srinivas1,Chan Kim-Fung1,Piccardi Michael1,Xu Kevin1,Wang Guan1,Shakeri Kaveh1,Patel Vipul1,Iwasaki Tomoko1,Wang Tongji1,Musunuri Padma1,Gu Carl1,Mohammadzadeh Ali1,Ghalam Ali1,Moschiano Violante2,Vali Tommaso2,Park Jaekwan1,Lee June1,Ghodsi Ramin1

Affiliation:

1. Micron Technology,San Jose,CA

2. Micron Technology,Avezzano,Italy

Publisher

IEEE

Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. High-Density 3-D NAND Cell Array Design With Hybrid Bonding;IEEE Transactions on Electron Devices;2023-11

2. High-Precision Short-Term Lifetime Prediction in TLC 3-D NAND Flash Memory as Hot-Data Storage;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-10

3. Understanding the impact of polysilicon percolative conduction on 3D NAND variability;2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2023-09-27

4. Reliability of 3D NAND Flash for Future Storage Systems (Invited);2023 IEEE International Reliability Physics Symposium (IRPS);2023-03

5. Insights into device and material origins and physical mechanisms behind cross temperature in 3D NAND;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03

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