13.2 A 1Tb 4b/Cell 96-Stacked-WL 3D NAND Flash Memory with 30MB/s Program Throughput Using Peripheral Circuit Under Memory Cell Array Technique

Author:

Huh Hwang,Cho Wanik,Lee Jinhaeng,Noh Yujong,Park Yongsoon,Ok Sunghwa,Kim Jongwoo,Cho Kayoung,Lee Hyunchul,Kim Geonu,Park Kangwoo,Kim Kwanho,Lee Heejoo,Chai Sooyeol,Kwon Chankeun,Cho Hanna,Jeong Chanhui,Yang Yujin,Goo Jayoon,Park Jangwon,Lee Juhyeong,Kirr Heonki,Jo Kangwook,Park Cheoljoong,Nam Hyeonsu,Song Hyunseok,Lee Sangkyu,Jeong Woopyo,Ahn Kun-Ok,Jung Tae-Sung

Publisher

IEEE

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2. Voltage scheme for string-select transistors to improve inhibition characteristics during 1-bit erase in vertical NAND flash;Applied Physics Letters;2023-10-02

3. A Study of Invalid Programming in 3D QLC NAND Flash Memories;Proceedings of the 15th ACM Workshop on Hot Topics in Storage and File Systems;2023-07-09

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5. Edge Word-Line Reliability Problem in 3-D NAND Flash Memory: Observations, Analysis, and Solutions;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-06

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