Understanding the impact of polysilicon percolative conduction on 3D NAND variability-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Understanding the impact of polysilicon percolative conduction on 3D NAND variability

Published:2023-09-27 Issue: Volume: Page:
ISSN:
Container-title:2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
language:
Short-container-title:

Author:

Amoroso Salvatore Maria¹,Malavena Gerardo²,Brown Andrew R.¹,Asenov Plamen¹,Lin Xi-Wei³,Moroz Victor³,Giulianini Mattia²,Refaldi David Gianluigi²,Compagnoni Christian Monzio²,Spinelli Alessandro Sottocornola²

Affiliation:

1. Synopsys Northern Europe, Ltd,Glasgow,UK,G3 8HB

2. Informazione e Bioingegneria,Politecnico di Milano Dipartimento Elettronica,Milan,Italy,20133

3. Synopsys, Inc,Sunnyvale,CA,USA

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10319472/10319477/10319604.pdf?arnumber=10319604

Reference14 articles.

1. Investigation of Random Telegraph Noise Under Different Programmed Cell V_t Levels in Charge Trap Based 3D NAND Flash

2. Threshold voltage, field effect mobility, and gate-to-channel capacitance in polysilicon TFTs

3. Random Telegraph Noise Intensification After High-Temperature Phases in 3-D NAND Flash Arrays

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Discrete-Trap Effects on 3-D NAND Variability – Part II: Random Telegraph Noise;IEEE Journal of the Electron Devices Society;2024

2. Discrete-Trap Effects on 3-D NAND Variability – Part I: Threshold Voltage;IEEE Journal of the Electron Devices Society;2024

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP