Simulation of clustering and transient enhanced diffusion of boron in silicon
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.368720
Reference24 articles.
1. Rapid annealing and the anomalous diffusion of ion implanted boron into silicon
2. Implantation damage and the anomalous transient diffusion of ion‐implanted boron
3. Transient diffusion of ion‐implanted B in Si: Dose, time, and matrix dependence of atomic and electrical profiles
4. Diffusion of boron in silicon during post‐implantation annealing
5. A model for boron short time annealing after ion implantation
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