Measuring low loss dielectric substrates with scanning probe microscopes-Reference-Cited by-同舟云学术

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Measuring low loss dielectric substrates with scanning probe microscopes

Published:2014-07-07 Issue:1 Volume:105 Page:013102
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Hoffmann Johannes¹,Gramse Georg²,Niegemann Jens³,Zeier Markus¹,Kienberger Ferry⁴

Affiliation:

1. Federal Institute of Metrology, METAS, Lindenweg 50, 3003 Bern-Wabern, Switzerland

2. Biophysics Department, Johannes Kepler University Linz, Gruberstr. 40, 4020 Linz, Austria

3. Institute of Electromagnetic Fields (IEF), ETH Zurich, Gloriastrasse 35, 8092 Zurich, Switzerland

4. Agilent Technologies Austria GmbH, Measurement Research Lab Linz, Gruberstrasse 40, 4020 Linz, Austria

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4886965

Reference11 articles.

1. Quantitative microwave near-field microscopy of dielectric properties

2. Calibration of shielded microwave probes using bulk dielectrics

3. Calibrated complex impedance and permittivity measurements with scanning microwave microscopy

4. L. Fumagalli , G. Gramse , D. Esteban-Ferrer , M. Edwards , and G. Gomila , Appl. Phys. Lett. 96, 183107 (2010).

5. Quantifying the dielectric constant of thick insulators by electrostatic force microscopy: effects of the microscopic parts of the probe

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