Quantifying the dielectric constant of thick insulators using electrostatic force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3427362
Reference15 articles.
1. Quantitative Analysis of Dielectric Constants from EFM Images of Multicomponent Polymer Blends
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5. Near-Static Dielectric Polarization of Individual Carbon Nanotubes
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