Physics-Assisted Learning Scheme for Quantitative Imaging via Near-Field Scanning Microwave Microscopy-Reference-Cited by-同舟云学术

Physics-Assisted Learning Scheme for Quantitative Imaging via Near-Field Scanning Microwave Microscopy

Published:2023-07 Issue:7 Volume:71 Page:3026-3036
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Zhou Yulong¹^ORCID,Leng Ning²^ORCID,Wei Zhun³^ORCID,Yin Tiantian¹,Bai Ming²^ORCID,Chen Xudong¹^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, National University of Singapore, Queenstown, Singapore

2. School of Electronic and Information Engineering, Beihang University, Beijing, China

3. State Key Laboratory of Modern Optical Instrumentation, College of Information Science and Electronic Engineering, Zhejiang University, Hangzhou, China

Funder

Singapore Ministry of Education

Open Foundation of the State Key Laboratory of Modern Optical Instrumentation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/10169131/10032270.pdf?arnumber=10032270

Reference45 articles.

1. Quantitative microwave evanescent microscopy of dielectric thin films using a recursive image charge approach

2. Deep neural networks for understanding noisy data applied to physical property extraction in scanning probe microscopy

3. Quantitative microwave near-field microscopy of dielectric properties

4. Image reconstruction for sub-sampled atomic force microscopy images using deep neural networks

5. Nanoscale terahertz scanning probe microscopy

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