Quantitative microwave near-field microscopy of dielectric properties
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Published:1998-11
Issue:11
Volume:69
Page:3846-3851
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ISSN:0034-6748
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Container-title:Review of Scientific Instruments
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language:en
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Short-container-title:Review of Scientific Instruments
Author:
Gao C.,Xiang X.-D.
Cited by
248 articles.
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