Calibration of shielded microwave probes using bulk dielectrics-Reference-Cited by-同舟云学术

Calibration of shielded microwave probes using bulk dielectrics

Published:2008-09-22 Issue:12 Volume:93 Page:123105
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Lai K.,Kundhikanjana W.,Kelly M. A.,Shen Z. X.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.2990638

Reference17 articles.

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3. A novel STM-assisted microwave microscope with capacitance and loss imaging capability

4. 0.4 μm spatial resolution with 1 GHz (λ=30 cm) evanescent microwave probe

5. Novel millimeter‐wave near‐field resistivity microscope

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