A novel STM-assisted microwave microscope with capacitance and loss imaging capability-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A novel STM-assisted microwave microscope with capacitance and loss imaging capability

Published:2003-04 Issue:3-4 Volume:94 Page:209-216
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Imtiaz Atif,Anlage Steven M.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference28 articles.

1. Scanning capacitance microscopy

2. Charge storage in a nitride‐oxide‐silicon medium by scanning capacitance microscopy

3. Scanning capacitance microscopy on a 25 nm scale

4. A novel capacitance microscope

5. Imaging conducting surfaces and dielectric films by a scanning capacitance microscope

Cited by 49 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Scanning Microwave Microscopy Subsurface Detection of Magneto-Impedance Effect in Thin Film Permalloy;2024 IEEE/MTT-S International Microwave Symposium - IMS 2024;2024-06-16

2. Coplanar waveguide ground potential imbalance as a source of useful signal in near-field scanning microwave microscopy;AIP Advances;2024-01-01

3. Nanoscale Characterization of Graphene Oxide-Based Epoxy Nanocomposite Using Inverted Scanning Microwave Microscopy;Sensors;2022-12-08

4. Real-Time Removal of Topographic Artifacts in Scanning Microwave Microscopy;IEEE Transactions on Microwave Theory and Techniques;2021-05

5. A Microwave Near-field 3D Super-resolution Imaging Method;Experimental Mechanics;2021-03-30

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP