Calibrated complex impedance and permittivity measurements with scanning microwave microscopy-Reference-Cited by-同舟云学术

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Calibrated complex impedance and permittivity measurements with scanning microwave microscopy

Published:2014-03-14 Issue:14 Volume:25 Page:145703
ISSN:0957-4484
Container-title:Nanotechnology
language:
Short-container-title:Nanotechnology

Author:

Gramse G,Kasper M,Fumagalli L,Gomila G,Hinterdorfer P,Kienberger F

Publisher

IOP Publishing

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Mechanics of Materials,General Materials Science,General Chemistry,Bioengineering

Link

http://stacks.iop.org/0957-4484/25/i=14/a=145703/pdf

Reference26 articles.

1. High‐resolution capacitance measurement and potentiometry by force microscopy

2. Two-dimensional carrier profiling of InP structures using scanning spreading resistance microscopy

3. Scanning spreading resistance microscopy and spectroscopy for routine and quantitative two-dimensional carrier profiling

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