Advanced calibration kit for scanning microwave microscope: Design, fabrication, and measurement
Author:
Affiliation:
1. RF and Microwave Laboratory of the Federal Institute of Metrology METAS of Switzerland, 3003 Bern-Wabern, Switzerland
2. Institute of Electromagnetic Fields (IEF), ETH Zurich, 8092 Zurich, Switzerland
Funder
European Union Horizon H2020
Publisher
AIP Publishing
Subject
Instrumentation
Link
https://aip.scitation.org/doi/pdf/10.1063/5.0032129
Reference16 articles.
1. Design of nanocapacitors and associated materials challenges
2. Nondestructive Imaging of Dielectric-Constant Profiles and Ferroelectric Domains with a Scanning-Tip Microwave Near-Field Microscope
3. Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz
4. Measuring low loss dielectric substrates with scanning probe microscopes
5. Mobile metallic domain walls in an all-in-all-out magnetic insulator
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