Nondestructive Imaging of Dielectric-Constant Profiles and Ferroelectric Domains with a Scanning-Tip Microwave Near-Field Microscope-Reference-Cited by-同舟云学术

Nondestructive Imaging of Dielectric-Constant Profiles and Ferroelectric Domains with a Scanning-Tip Microwave Near-Field Microscope

Published:1997-06-27 Issue:5321 Volume:276 Page:2004-2006
ISSN:0036-8075
Container-title:Science
language:en
Short-container-title:Science

Author:

Lu Yalin¹²³,Wei Tao¹²³,Duewer Fred¹²³,Lu Yanqing¹²³,Ming Nai-Ben¹²³,Schultz P. G.¹²³,Xiang X.-D.¹²³

Affiliation:

1. Y. Lu, F. Duewer, X.-D. Xiang, Molecular Design Institute, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

2. T. Wei and P. G. Schultz, Howard Hughes Medical Institute and Molecular Design Institute, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.

3. Y. Lu and N.-B. Ming, National Laboratory of Solid State Microstructures, NanJing University, NanJing 210093, China.

Abstract

Variations in dielectric constant and patterns of microwave loss have been imaged in a yttrium-doped LiNbO 3 crystal with periodic ferroelectric domains with the use of a scanning-tip near-field microwave microscope. Periodic profiles of dielectric constant and images of ferroelectric domain boundaries were observed at submicrometer resolution. The combination of these images showed a growth-instability–induced defect of periodic domain structure. Evidence of a lattice-edge dislocation has also been observed through a stress-induced variation in dielectric constant.

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

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