Stabilization of the Ferroelectric Phase in Epitaxial Hf1–xZrxO2 Enabling Coexistence of Ferroelectric and Enhanced Piezoelectric Properties-Reference-Cited by-同舟云学术

Stabilization of the Ferroelectric Phase in Epitaxial Hf1–xZrxO2 Enabling Coexistence of Ferroelectric and Enhanced Piezoelectric Properties

Published:2021-04-22 Issue:5 Volume:3 Page:2106-2113
ISSN:2637-6113
Container-title:ACS Applied Electronic Materials
language:en
Short-container-title:ACS Appl. Electron. Mater.

Author:

Song Tingfeng¹,Tan Huan¹,Dix Nico¹,Moalla Rahma²,Lyu Jike¹,Saint-Girons Guillaume²^ORCID,Bachelet Romain²^ORCID,Sánchez Florencio¹^ORCID,Fina Ignasi¹^ORCID

Affiliation:

1. Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, E-08193 Bellaterra, Barcelona 08193, Spain

2. Institut des Nanotechnologies de Lyon (INL-CNRS UMR 5270), Université de Lyon, Ecole Centrale de Lyon, 36 Avenue Guy de Collongue, Ecully Cedex 69134, France

Funder

Fundaci?n BBVA

Agence Nationale de la Recherche

Ministerio de Ciencia e Innovaci?n

China Scholarship Council

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Electrochemistry,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaelm.1c00122

Reference50 articles.