Ferroelectric Zr0.5Hf0.5O2thin films for nonvolatile memory applications
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3636417
Reference14 articles.
1. FeRAM technology for high density applications
2. Integration of lead zirconium titanate thin films for high density ferroelectric random access memory
3. Ferroelectricity in hafnium oxide thin films
4. A. Berthelot, C. Caillat, V. Huard, S. Barnola, B. Boeck, H. Del-Puppo, N. Emonet, and F. Lalanne, 2006 European Solid State Device Research Conference, ESSDERC 2006, Montreux, 19–21 September 2006, p. 343.
5. Improved manufacturability of ZrO2 MIM capacitors by process stabilizing HfO2 addition
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