Author:
Mikolajick T.,Dehm C.,Hartner W.,Kasko I.,Kastner M.J.,Nagel N.,Moert M.,Mazure C.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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4. Moert M, Schindler G, Hartner W, Kasko I, Kastner M, Mikolajick T, Dehm C, Waser R. Integrated Ferroelectrics 2000;30(1–4):235
5. Hintermaier F, et al. VLSI Technol Dig 1999:56
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