Enhanced Electrical Performance and Bias‐Stress Stability of Solution‐Processed Bilayer Metal Oxide Thin‐Film Transistors

Author:

Sun Qi-Jun1ORCID,Wu Jinxuan2,Zhang Meng2,Yuan Yu3,Gao Xu3,Wang Sui-Dong3,Tang Zhenhua1,Kuo Chi-Ching4ORCID,Yan Yan2

Affiliation:

1. School of Physics and Optoelectric Engineering Guangdong University of Technology Guangzhou 511400 P. R. China

2. College of Electronic and Information Engineering Shenzhen University Shenzhen 518060 China

3. Institute of Functional Nano & Soft Materials (FUNSOM) Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices Soochow University Suzhou 215123 China

4. Institute of Organic and Polymeric Materials Research and Development Center of Smart Textile Technology National Taipei University of Technology Taipei 710100 Taiwan

Funder

National Natural Science Foundation of China

Natural Science Foundation of Guangdong Province

Publisher

Wiley

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

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