Affiliation:
1. Purdue University, West Lafayette, IN
Abstract
This article describes a new procedure that generates seeds for
LFSR
-based test generation when the goal is to produce an
n
-detection test set. The procedure does not use test cubes in order to avoid the situation where a seed does not exist for a given test cube with a given
LFSR
. Instead, the procedure starts from a set of seeds that produces a one-detection test set. It modifies seeds to obtain new seeds such that the tests they produce increase the numbers of detections of target faults. The modification procedure also increases the number of faults that each additional seed detects. Experimental results are presented to demonstrate the effectiveness of the procedure.
Publisher
Association for Computing Machinery (ACM)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications
Cited by
3 articles.
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