Special Session: Survey of Test Point Insertion for Logic Built-in Self-test-Reference-Cited by-同舟云学术

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Special Session: Survey of Test Point Insertion for Logic Built-in Self-test

Published:2020-04 Issue: Volume: Page:
ISSN:
Container-title:2020 IEEE 38th VLSI Test Symposium (VTS)
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Author:

Sun Yang,Millican Spencer K.,Agrawal Vishwani D.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9106465/9107548/09107584.pdf?arnumber=9107584

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Test Point Selection for Multi-Cycle Logic BIST using Multivariate Temporal-Spatial GCNs;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18

2. A Survey and Recent Advances: Machine Intelligence in Electronic Testing;Journal of Electronic Testing;2024-04

3. Test Point Selection Using Deep Graph Convolutional Networks and Advantage Actor Critic (A2C) Reinforcement Learning;2023 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC);2023-06-25

4. Applying Artificial Neural Networks to Logic Built-in Self-test: Improving Test Point Insertion;Journal of Electronic Testing;2022-08

5. Computing in Finite Fields;2022 Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus);2022-01-25

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