Author:
Barnhart C.,Brunkhorst V.,Distler F.,Farnsworth O.,Keller B.,Koenemann B.
Cited by
168 articles.
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1. Test Compaction Using (k, 1)-Cycle Tests;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. Mirroring ATPG Technology for Multi-Core Chips;2024 Conference of Science and Technology for Integrated Circuits (CSTIC);2024-03-17
3. Dynamic Test Compaction of a Compressed Test Set Shared Among Logic Blocks;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-01
4. Sharing of Topped-Off Compressed Test Sets Among Logic Blocks;IEEE Access;2024
5. Dummy Faulty Units for Reduced Fail Data Volume From Logic Faults;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-11