Author:
Acevedo Oscar,Kagaris Dimitri
Cited by
20 articles.
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1. Reduced On-chip Storage of Seeds for Built-in Test Generation;ACM Transactions on Design Automation of Electronic Systems;2024-03-14
2. Memory-Efficient LFSR Encoding and Weightage Driven Bit Transition for Improved Fault Coverage;IETE Journal of Research;2021-08-04
3. Padding of LFSR Seeds for Reduced Input Test Data Volume;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021-05
4. Compact Set of LFSR Seeds for Diagnostic Tests;2021 IEEE 39th VLSI Test Symposium (VTS);2021-04-25
5. Storage-Based Logic Built-In Self-Test with Multicycle Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021