Author:
Alampally S.,Venkatesh R. T.,Shanmugasundaram P.,Parekhji R. A.,Agrawal V. D.
Cited by
36 articles.
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1. Test Compaction Using (k, 1)-Cycle Tests;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. Dynamic Test Compaction of a Compressed Test Set Shared Among Logic Blocks;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-01
3. Sharing of Topped-Off Compressed Test Sets Among Logic Blocks;IEEE Access;2024
4. Testability Evaluation for Local Design Modifications;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-01
5. Incomplete Testing of SOC;Journal of Electronic Testing;2023-05-29