SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments-Reference-Cited by-同舟云学术

SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments

Published:2022-03-14 Issue: Volume: Page:
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Container-title:2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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Author:

Yan Aibin¹,Li Zhixing¹,Huang Shiwei¹,Zhai Zijie¹,Cheng Xiangyu¹,Cui Jie¹,Ni Tianming²,Wen Xiaoqing³,Girard Patrick⁴

Affiliation:

1. School of Computer Science and Technology, Anhui University,Key Laboratory of Intelligent Computing and Signal Processing of Ministry of Education,Hefei,China

2. College of Electrical Engineering, Anhui Polytechnic University,Wuhu,China

3. Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology,Fukuoka,Japan

4. LIRMM, University of Montpellier / CNRS,Montpellier,France

Funder

National Natural Science Foundation of China

Chinese Academy of Sciences

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9774496/9774497/09774665.pdf?arnumber=9774665

Reference21 articles.

1. A Low Power Soft Error Hardened Latch with Schmitt-Trigger-Based C-Element

2. Low cost soft error hardened latch designs for nano-scale CMOS technology in presence of process variation

3. A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology

4. Low‐cost single event double‐upset tolerant latch design

5. Delta DICE: A Double Node Upset resilient latch

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