ICLTR: A Input-split Inverters and C-elements based Low-Cost Latch with Triple-Node-Upset Recovery-Reference-Cited by-同舟云学术

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ICLTR: A Input-split Inverters and C-elements based Low-Cost Latch with Triple-Node-Upset Recovery

Published:2024-08-18 Issue: Volume: Page:1-6
ISSN:
Container-title:2024 IEEE International Test Conference in Asia (ITC-Asia)
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Author:

Zhang Jiajia¹,Li Zhenmin²,Shan Gaoyang³,Song Jie¹,Guo Xing¹,Wen Xiaoqing⁴

Affiliation:

1. Anhui University,School of Computer Science and Technology,Hefei,China

2. Hefei University of Technology,School of Microelectronics,Hefei,China

3. Ajou University,Department of Software and Computer Engineering,Suwon,Korea

4. Kyushu Institute of Technology,Department of Computer Science and Networks,Fukuoka,Japan

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10661305/10661306/10661358.pdf?arnumber=10661358

Reference17 articles.

1. Process Dependence of Soft Errors Induced by Alpha Particles, Heavy Ions, and High Energy Neutrons on Flip Flops in FDSOI

2. Soft Errors Induced by High-Energy Electrons

3. LDAVPM: A Latch Design and Algorithm-based Verification Protected against Multiple-Node-Upsets in Harsh Radiation Environments

4. SEU concept to reality (allocation, prediction, mitigation)

5. A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology

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