LDAVPM: A Latch Design and Algorithm-based Verification Protected against Multiple-Node-Upsets in Harsh Radiation Environments-Reference-Cited by-同舟云学术

LDAVPM: A Latch Design and Algorithm-based Verification Protected against Multiple-Node-Upsets in Harsh Radiation Environments

Published:2022 Issue: Volume: Page:1-1
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Yan Aibin¹^ORCID,Li Zhixing¹,Cui Jie¹^ORCID,Huang Zhengfeng²^ORCID,Ni Tianming³,Girard Patrick⁴^ORCID,Wen Xiaoqing⁵^ORCID

Affiliation:

1. School of Computer Science and Technology, Anhui University, Hefei, China

2. School of Microelectronic, Hefei University of Technology, Hefei, China

3. College of Electrical Engineering, Anhui Polytechnic University, Wuhu, China

4. Laboratory of Informatics, Robotics and Microelectronics of Montpellier, University of Montpellier / CNRS, Montpellier, France

5. Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Fukuoka, Japan

Funder

JSPS Grant-in-Aid for Scientific Research

Open Project of the State Key Laboratory of Computing Institute of Chinese Academy of Sciences

NSFC-JSPS Exchange Program

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

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