MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method-Reference-Cited by-同舟云学术

MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method

Published:2024-07 Issue:7 Volume:43 Page:2205-2214
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Yan Aibin¹^ORCID,Li Zhixing²^ORCID,Gao Zhongyu²^ORCID,Zhang Jing²,Huang Zhengfeng¹^ORCID,Ni Tianming³^ORCID,Cui Jie²^ORCID,Wang Xiaolei¹,Girard Patrick⁴^ORCID,Wen Xiaoqing⁵^ORCID

Affiliation:

1. School of Microelectronics, Hefei University of Technology, Hefei, China

2. School of Computer Science and Technology, Anhui University, Hefei, China

3. Anhui Provincial Engineering Research Center of Vehicle Display Integrated Systems, School of Integrated Circuits, Anhui Polytechnic University, Wuhu, China

4. Laboratory of Informatics, Robotics and Microelectronics of Montpellier, University of Montpellier/CNRS, Montpellier, France

5. Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Fukuoka, Japan

Funder

National Natural Science Foundation of China

Outstanding Young Talent Support Program Key Project of Anhui Province

Distinguished Young Scholar Fund of Anhui Province

Key Research and Development Project in Anhui Province

Excellent Scientific Research and Innovation Teams of Anhui Province

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/43/10564796/10413196.pdf?arnumber=10413196