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Process Dependence of Soft Errors Induced by Alpha Particles, Heavy Ions, and High Energy Neutrons on Flip Flops in FDSOI

  • Published:2019 Issue: Volume:7 Page:817-824
  • ISSN:2168-6734
  • Container-title:IEEE Journal of the Electron Devices Society
  • language:
  • Short-container-title:IEEE J. Electron Devices Soc.

Author:

Ebara MitsunoriORCID,Yamada KodaiORCID,Kojima KentaroORCID,Furuta JunORCID,Kobayashi KazutoshiORCID

Funder

Japan Science and Technology Agency

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials,Biotechnology

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Low-Delay Quadruple-Node-Upset Self-Recoverable Latch Design;2023 IEEE 32nd Asian Test Symposium (ATS);2023-10-14

2. Frequency Dependency of Soft Error Rates Based on Dynamic Soft Error Measurements;2023 International Conference on IC Design and Technology (ICICDT);2023-09-25

3. Radiation Hardness Evaluations of a Stacked Flip Flop in a 22 nm FD-SOI Process by Heavy-Ion Irradiation;2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS);2023-07-03

4. Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets;Journal of Electronic Testing;2023-05-09

5. Design of a Highly Reliable Low Power Stacked Inverter-Based SRAM Cell with Advanced Self-recoverability from Soft Errors;Advances in Cognitive Science and Communications;2023
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