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Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments

  • Published:2020-04 Issue:2 Volume:56 Page:1163-1171
  • ISSN:0018-9251
  • Container-title:IEEE Transactions on Aerospace and Electronic Systems
  • language:
  • Short-container-title:IEEE Trans. Aerosp. Electron. Syst.

Author:

Yan AibinORCID,Feng Xiangfeng,Hu YuanjieORCID,Lai Chaoping,Cui JieORCID,Chen ZhiliORCID,Miyase Kohei,Wen XiaoqingORCID

Funder

National Natural Science Foundation of China

Anhui University Doctor Startup Fund

China Scholarship Council

JSPS Grant-in-Aid for Scientific Research

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Aerospace Engineering

Cited by 65 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. CQCTL: A Cost-Optimized and Quadruple-Node-Upset Completely Tolerant Latch Design for Safety-Critical Applications;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18

2. ICLTR: A Input-split Inverters and C-elements based Low-Cost Latch with Triple-Node-Upset Recovery;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18

3. SRBML: A Single-Event-Upset Recoverable and BTI-Mitigated Latch Design for Long-Term Reliability Enhancement;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18

4. Design of novel low cost triple-node-upset self-recoverable hardened latch;Integration;2024-07

5. MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-07
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