Author:
Maingault Laurent,Anceau Stéphanie,Sulmont Manuel,Salvo Luc,Clediere Jessy,Lhuissier Pierre,Beliard Emrick,Rainard Jean Luc
Publisher
Springer International Publishing
Cited by
6 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Non-Invasive Attack on Ring Oscillator-Based PUFs Through Localized X-Ray Irradiation;2024 IEEE International Symposium on Hardware Oriented Security and Trust (HOST);2024-05-06
2. Enhancing Side-Channel Attacks Through X-Ray-Induced Leakage Amplification;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25
3. X-Ray Fault Injection in Non-Volatile Memories on Power OFF Devices;2023 IEEE Physical Assurance and Inspection of Electronics (PAINE);2023-10-24
4. X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated circuits;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
5. Ray-Spect: Local Parametric Degradation for Secure Designs: An application to X-Ray Fault Injection;2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS);2023-07-03