X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated circuits
Author:
Affiliation:
1. Univ. Grenoble Alpes, CEA Leti,Grenoble,France,F-38000
2. Univ. Grenoble Alpes, CNRS UMR5266, Grenoble INP, Laboratoire SIMaP,Grenoble,France,38000
3. ESRF,Grenoble,France,38000
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10313343/10313345/10313553.pdf?arnumber=10313553
Reference28 articles.
1. Radiation Effects in Flash Memories
2. Failure Analysis: A Practical Guide for Manufacturers of Electronic Components and Systems;Marius Bazu and Titu Bajenescu,2011
3. Laboratory X-rays Operando Single Bit Attacks on Flash Memory Cells
4. Nanofocused X-Ray Beam to Reprogram Secure Circuits;anceau;CHES 2017,2017
5. Probing Attacks on Integrated Circuits: Challenges and Research Opportunities
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