Enhancing Side-Channel Attacks Through X-Ray-Induced Leakage Amplification-Reference-Cited by-同舟云学术

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Enhancing Side-Channel Attacks Through X-Ray-Induced Leakage Amplification

Published:2024-03-25 Issue: Volume: Page:1-6
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Container-title:2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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Author:

Tebina Nasr-eddine Ouldei¹,Salvo Luc²,Maingault Laurent³,Zergainoh Nacer-Eddine¹,Hubert Guillaume⁴,Maistri Paolo⁵

Affiliation:

1. Univ Grenoble Alpes,CNRS, Grenoble INP*, TIMA,Grenoble,France,38000

2. Univ Grenoble Alpes,CNRS, Grenoble INP*, SIMaP,Grenoble,France,38000

3. CEA-Leti,Grenoble,France,38054

4. University of Toulouse,ONERA DPHY,Toulouse,France,31055

5. Institute of Engineering Univ. Grenoble Alpes

Funder

French National Research Agency

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10546498/10546499/10546614.pdf?arnumber=10546614

Reference20 articles.

1. Differential Power Analysis

2. Electromagnetic Analysis: Concrete Results

3. On the importance of checking cryptographic protocols for faults (extended abstract);Boneh,1997

4. Combined Fault and Side-Channel Attack on Protected Implementations of AES

5. One Plus One is More than Two: A Practical Combination of Power and Fault Analysis Attacks on PRESENT and PRESENT-Like Block Ciphers

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