Author:
Burns Daniel J.,Pronobis Mark T.,Eldering Charles A.,Hillman Robert J.
Cited by
3 articles.
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1. X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated circuits;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
2. Laboratory X-rays Operando Single Bit Attacks on Flash Memory Cells;Smart Card Research and Advanced Applications;2022
3. Nanofocused X-Ray Beam to Reprogram Secure Circuits;Lecture Notes in Computer Science;2017