Author:
Anceau Stéphanie,Bleuet Pierre,Clédière Jessy,Maingault Laurent,Rainard Jean-luc,Tucoulou Rémi
Publisher
Springer International Publishing
Reference30 articles.
1. Lecture Notes in Computer Science;SP Skorobogatov,2003
2. Habing, D.H.: The use of lasers to simulate radiation-induced transients in semiconductor devices and circuits. IEEE Trans. Nucl. Sci. 12, 91–100 (1965)
3. Henley, F.J.: Logic failure analysis of CMOS VLSI using a laser probe. In: 22nd Annual Reliability Physics Symposium, pp. 69–75 (1984)
4. Burns, D., Pronobis, M., Eldering, C., Hillman, R.: Reliability/design assessment by internal-node timing-margin analysis using laser photocurrent injection. In: 22nd Annual Proceedings on Reliability Physics 1984, pp. 76–82. IEEE (1984)
5. Hériveaux, L., Clédière, J., Anceau, S.: Electrical modeling of the effect of photoelectric laser fault injection on bulk CMOS design. In: 39th International Symposium for Testing and Failure Analysis ISTFA (2013)
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