X-Ray Fault Injection in Non-Volatile Memories on Power OFF Devices-Reference-Cited by-同舟云学术

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X-Ray Fault Injection in Non-Volatile Memories on Power OFF Devices

Published:2023-10-24 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE Physical Assurance and Inspection of Electronics (PAINE)
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Author:

Grandamme Paul¹,Bossuet Lilian¹,Dutertre Jean-Max²

Affiliation:

1. Université Jean Monnet Saint-Etienne,Laboratoire Hubert Curien UMR 5516,France

2. Mines Saint-Etienne CEA,France

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10317939/10317942/10318018.pdf?arnumber=10318018

Reference17 articles.

1. Radiation Effects in Flash Memories

2. Optical Fault Masking Attacks

3. Chipwhisperer: An open-source plat-form for hardware embedded security research;o'flynn;Constructive Side-Channel Analysis and Secure Design-5th International Workshop COSADE 2014,2014

4. X-ray imaging physics for nuclear medicine technologists. part 1: Basic principles of x-ray production;seibert;Journal of Nuclear Medicine Technology,2004

5. Laboratory x-rays operando single bit attacks on flash memory cells;maingault;20th Smart Card Research and Advanced Application Conference-CARDIS 2021,2021

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Non-Invasive Attack on Ring Oscillator-Based PUFs Through Localized X-Ray Irradiation;2024 IEEE International Symposium on Hardware Oriented Security and Trust (HOST);2024-05-06

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