Off-state stress degradation mechanism on advanced p-MOSFETs
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx7/7153312/7165871/07165893.pdf?arnumber=7165893
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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