Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology
Author:
Affiliation:
1. Device Reliability and Electrical Characterization Team, imec, Leuven, Belgium
2. Electrical and Functional Test Team, imec, Leuven, Belgium
3. ESAT-MICAS, KU Leuven, Leuven, Belgium
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/7298/10242179/10159151.pdf?arnumber=10159151
Reference29 articles.
1. A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection Capability
2. Ubiquitous relaxation in BTI stressing—New evaluation and insights
3. Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits
4. Statistical assessment of the full VG/VD degradation space using dedicated device arrays;bury;Proc IEEE Int Rel Phys Symp (IRPS),2017
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage;Micromachines;2024-06-08
2. The Optimization of Aging-aware 8T SRAM for FPGA Configuration Memory;2024 IEEE International Symposium on Circuits and Systems (ISCAS);2024-05-19
3. Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14
4. Statistical Characterization of Off-State Stress Degradation in Planar HKMG nFETs Using Device Arrays;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3