Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits-Reference-Cited by-同舟云学术

Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits

Published:2020-03 Issue:3 Volume:69 Page:853-864
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Diaz-Fortuny Javier^ORCID,Saraza-Canflanca Pablo^ORCID,Castro-Lopez Rafael^ORCID,Roca Elisenda^ORCID,Martin-Martinez Javier^ORCID,Rodriguez Rosana^ORCID,Fernandez Francisco V.^ORCID,Nafria Montserrat^ORCID

Funder

Ministry of Science, Innovation and Universities (MICINN) and European Regional Development Fund

MICINN through the FPI, respectively

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/8989837/08693966.pdf?arnumber=8693966

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage;Micromachines;2024-06-08

2. Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology;IEEE Transactions on Device and Materials Reliability;2023-09

3. Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03

4. A Test Module for Aging Characterization of Digital Circuits;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03

5. The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper);2023 IEEE International Reliability Physics Symposium (IRPS);2023-03