Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology
Author:
Affiliation:
1. imec,Leuven,Belgium,3001
2. Universitat Politècnica de Catalunya,Departament d'Enginyeria Electrònica,Barcelona,Spain,08034
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10529283/10529298/10529453.pdf?arnumber=10529453
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1. CMOS Reliability from Past to Future: A Survey of Requirements, Trends, and Prediction Methods
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3. Long-Term Aging Impacts on Spatial On-Chip Power Density and Temperature
4. Precise Turbo Frequency Tuning and Shared Resource Optimisation for Energy-Efficient Cloud Native Workloads
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