Effective DC fault models and testing approach for open defects in analog circuits-Reference-Cited by-同舟云学术

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Effective DC fault models and testing approach for open defects in analog circuits

Published:2016-11 Issue: Volume: Page:
ISSN:
Container-title:2016 IEEE International Test Conference (ITC)
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Author:

Esen Baris,Coyette Anthony,Gielen Georges,Dobbelaere Wim,Vanhooren Ronny

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7794484/7805805/07805830.pdf?arnumber=7805830

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Concept of Provably Detected Defects for Analog Defect Simulation Campaign Improvement;2024 IEEE European Test Symposium (ETS);2024-05-20

2. An efficient method for faults diagnosis in analog circuits based on machine learning classifiers;Alexandria Engineering Journal;2023-08

3. Verilog-A Implementation of Generic Defect Templates for Analog Fault Injection;Proceedings of the Great Lakes Symposium on VLSI 2023;2023-06-05

4. High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis;2023 IEEE European Test Symposium (ETS);2023-05-22

5. Machine Learning Support for Diagnosis of Analog Circuits;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22

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