High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis
Author:
Affiliation:
1. KU Leuven,Leuven,Belgium,3001
2. Onsemi Belgium,Oudenaarde,Belgium
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10173930/10173940/10173963.pdf?arnumber=10173963
Reference8 articles.
1. Effective DC fault models and testing approach for open defects in analog circuits
2. Practical random sampling of potential defects for analog fault simulation
3. A 52 dB-SFDR 166 MHz sinusoidal signal generator for mixed-signal BIST applications in 28 nm FDSOI technology
4. SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety
5. Impulse signal generation and measurement technique for cost-effective Built-In Self Test in analog mixed-signal systems
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