A Concept of Provably Detected Defects for Analog Defect Simulation Campaign Improvement-Reference-Cited by-同舟云学术

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A Concept of Provably Detected Defects for Analog Defect Simulation Campaign Improvement

Published:2024-05-20 Issue: Volume: Page:1-4
ISSN:
Container-title:2024 IEEE European Test Symposium (ETS)
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Author:

Zivkovic Vladimir A.¹,Abel Inga²,Candage Anthony³

Affiliation:

1. Infineon Technologies,Denmark

2. Infineon Technologies,Germany

3. Infineon Technologies,USA

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10567048/10567052/10567699.pdf?arnumber=10567699

Reference14 articles.

1. Practical random sampling of potential defects for analog fault simulation

2. Application of Sampling in Industrial Analog Defect Simulation

3. A $2 \times 70$ W Monolithic Five-Level Class-D Audio Power Amplifier in 180 nm BCD

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