Application of Sampling in Industrial Analog Defect Simulation-Reference-Cited by-同舟云学术

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Application of Sampling in Industrial Analog Defect Simulation

Published:2022-09 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE International Test Conference (ITC)
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Author:

Bhattacharya Mayukh¹,Solignac Beatrice²,Durr Michael¹

Affiliation:

1. Custom Design and Manufacturing Group Synopsys, Inc.,Mountain View,USA

2. Custom Design and Manufacturing Group Synopsys, Inc.,Montbonnot,France

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9983856/9983857/09983914.pdf?arnumber=9983914

Reference5 articles.

1. Effective DC fault models and testing approach for open defects in analog circuits

2. Robust misinterpretation of confidence intervals

3. PrimeSim Custom Fault;Sunnyvale,2021

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Concept of Provably Detected Defects for Analog Defect Simulation Campaign Improvement;2024 IEEE European Test Symposium (ETS);2024-05-20

2. Hierarchical Fault Simulation for Mixed-Signal Circuits Using Template Based Fault Response Modeling;2024 IEEE European Test Symposium (ETS);2024-05-20

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