Machine Learning Support for Diagnosis of Analog Circuits
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Publisher
Springer International Publishing
Link
https://link.springer.com/content/pdf/10.1007/978-3-031-19639-3_7
Reference133 articles.
1. Abdallah, L., Stratigopoulos, H.G., Mir, S., Kelma, C.: Experiences with non-intrusive sensors for RF built-in test. In: Proceedings of the IEEE International Test Conference, Paper 17.1 (2012).
2. Abdallah, L., Stratigopoulos, H.G., Mir, S., Altet, J.: Defect-oriented non-intrusive RF test using on-chip temperature sensors. In: Proceedings of the IEEE VLSI Test Symposium (2013)
3. Ahmadi, A., Stratigopoulos, H.G., Huang, K., Nahar, A., Orr, B., Pas, M., Carulli, J.M., Makris, Y.: Yield forecasting across semiconductor fabrication plants and design generations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(12), 2120–2133 (2017)
4. Akbay, S.S., Chatterjee, A.: Fault-based alternate test of RF components. In: IEEE International Conference on Computer Design, pp. 518–525 (2007)
5. Akbay, S.S., Halder, A., Chatterjee, A., Keezer, D.: Low-cost test of embedded RF/Analog/Mixed-signal circuits in SOPs. IEEE Trans. Adv. Packag. 27(2), 352–363 (2004)
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