An efficient method for faults diagnosis in analog circuits based on machine learning classifiers

Author:

Arabi Abderrazak,Ayad MouloudORCID,Bourouba Nacerdine,Benziane Mourad,Griche Issam,Ghoneim Sherif S.M.,Ali EnasORCID,Elsisi Mahmoud,Ghaly Ramy N.R.

Funder

Taif University

Deanship of Scientific Research, King Saud University

Publisher

Elsevier BV

Subject

General Engineering

Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Normalized signature graph of analog circuits for fault classification using digital testing;Ain Shams Engineering Journal;2024-08

2. Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental RMS of the Supply Current Fluctuation;2024 13th International Conference on Modern Circuits and Systems Technologies (MOCAST);2024-06-26

3. Analog Circuit Fault Diagnosis Based on Machine Learning Using Frequency Domain Features;2024 11th International Conference on Electrical, Electronic and Computing Engineering (IcETRAN);2024-06-03

4. Detecting and Classifying Parametric Faults in Analog Circuits Using an Optimized Attention Neural Networks;Circuits, Systems, and Signal Processing;2024-05-25

5. Fault detection in analog electronic circuits using fuzzy inference systems and particle swarm optimization;Alexandria Engineering Journal;2024-05

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