Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental RMS of the Supply Current Fluctuation-Reference-Cited by-同舟云学术

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Parametric Fault Detection of Analog Circuits by Utilizing the Fundamental RMS of the Supply Current Fluctuation

Published:2024-06-26 Issue: Volume: Page:01-04
ISSN:
Container-title:2024 13th International Conference on Modern Circuits and Systems Technologies (MOCAST)
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Author:

Vassios Vassilios D.¹,Hatzopoulos Argyrios.T.¹,Intzes Ioannis G.¹,Papakostas Dimitrios K.¹

Affiliation:

1. International Hellenic University,Department of Information and Electronic Engineering,Thessaloniki,Greece

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10615233/10615286/10615504.pdf?arnumber=10615504

Reference21 articles.

1. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

2. Assessing and comparing fault coverage when testing analogue circuits

3. Fault diagnosis of analog circuits with model-based technique

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