Normalized signature graph of analog circuits for fault classification using digital testing

Author:

El-Mahlawy Mohamed H.ORCID,Anas Mohamed Hamdy Sherif

Publisher

Elsevier BV

Reference41 articles.

1. A survey on fault diagnosis of analog circuits: taxonomy and state of the art;Binu;AEU-Int J Electron C,2017

2. Fast Monte Carlo-based estimation of analog parametric test metrics;Stratigopoulos;IEEE Trans Comput Aided Des Integr Circuits Syst,2014

3. New hybrid based self-test strategy for faulty modules of complex microcontroller systems;El-Mahlawy Mohamed;Electronics Journal,2018

4. Mousa Aiman, El-Mahlawy Mohamed H. Test pattern generator optimization for digital testing of analogue circuits. 8th IEEE international conference on intelligent computing and information systems (ICICIS 2017); Dec. 2017: 118–26.

5. New Board-Level Interconnect Fault Diagnosis Approach in Industrial Applications;Sayed;International Journal of Computing and Digital Systems,2021

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