Modelling Thermal Fatigue in Power Electronics

Author:

Dudek Rainer1,Doring Ralf1,Mathew Anu1,Otto Alexander1,Rzepka Sven1

Affiliation:

1. Fraunhofer ENAS,Dept. Micro Materials Center

Publisher

IEEE

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Investigation of an approach for the determination of the current State-of-Health and improvement of service life in power modules;2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2024-04-07

2. Finite Element Simulation and Sensitivity Analysis of the Cohesive Parameters for Delamination Modeling in Power Electronics Packages;Materials;2023-07-04

3. Failure Prediction and Analysis of an IGBT Module for Industrial Applications Subjected to Passive and Power Cycling;2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2023-04-17

4. Finite elements analyses of early-stage crack propagation in aluminum wire bonds due to power cycling;Microelectronics Reliability;2022-11

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