Finite Element Simulation and Sensitivity Analysis of the Cohesive Parameters for Delamination Modeling in Power Electronics Packages

Author:

Mirone Giuseppe1,Barbagallo Raffaele1ORCID,Bua Giuseppe12ORCID,La Rosa Guido1

Affiliation:

1. Department of Civil Engineering and Architecture, University of Catania, Viale A. Doria 6, 95125 Catania, Italy

2. Department of Electric, Electronic, and Computer Engineering, University of Catania, Via Santa Sofia 64, 95125 Catania, Italy

Abstract

Delamination is a critical failure mode in power electronics packages that can significantly impact their reliability and performance, due to the large amounts of electrical power managed by the most recent devices which induce remarkable thermomechanical loads. The finite element (FE) simulation of this phenomenon is very challenging for the identification of the appropriate modeling tools and their subsequent calibration. In this study, we present an advanced FE modeling approach for delamination, together with fundamental guidelines to calibrate it. Considering a reference power electronics package subjected to thermomechanical loads, FE simulations with a global–local approach are proposed, also including the implementation of a bi-linear cohesive zone model (CZM) to simulate the complex interfacial behavior between the different layers of the package. A parametric study and sensitivity analysis is presented, exploring the effects of individual CZM variables on the delamination behavior, identifying the most crucial ones and accurately describing their underlying functioning. Then, this work gives valuable insights and guidelines related to advanced and aware FE simulations of delamination in power electronics packages, useful for the design and optimization of these devices to mitigate their vulnerability to thermomechanical loads.

Funder

European Union

Publisher

MDPI AG

Subject

General Materials Science

Reference32 articles.

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