Electro-thermo-mechanical analyses on silver sintered IGBT-module reliability in power cycling

Author:

Dudek R.1,Doring R.1,Rzepka S.1,Ehrhardt C.2,Gunther M.3,Haag M.4

Affiliation:

1. Fraunhofer ENAS, Micro Materials Center Chemnitz, Germany

2. Fraunhofer IZM, Berlin, Germany

3. Robert Bosch GmbH, CR/APJ3, Stuttgart, Germany

4. Bertrandt Ingenieurbuero GmbH, Ingolstadt, Germany

Publisher

IEEE

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Mechanical Characterization of Sintered Silver Materials for Power Device Packaging: A Review;Energies;2024-08-18

2. Temporal and Spatial Differences in Thermal Transfer Behavior of IGBTs Caused by the Baseplate and Die-Attach Solder Cracking;IEEE Journal of Emerging and Selected Topics in Power Electronics;2022-12

3. Modelling Thermal Fatigue in Power Electronics;2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2022-04-25

4. Reliability and Failure Mechanisms of Sintered Silver as Die Attach Joint;Die-Attach Materials for High Temperature Applications in Microelectronics Packaging;2019

5. Application-Driven Reliability Research of Next Generation for Automotive Electronics: Challenges and Approaches;Journal of Electronic Packaging;2018-03-01

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